DocumentCode :
941445
Title :
Characterisation of a GaAs MESFET oscillator at 4.2 K
Author :
Vollmer, E. ; Gutmann, P. ; Niemeyer, J.
Author_Institution :
Phys.-Tech. Bundesanstalt, Braunschweig, Germany
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
2828
Lastpage :
2831
Abstract :
A stripline X-band oscillator for use in Josephson voltage standards and potentiometers has been designed and constructed. The oscillator, comprising a packaged GaAs MESFET, has been tested at temperatures of 300 K and 4.2 K. The conversion efficiency, the power leveling capability, the frequency tuning, and the phase noise have been investigated. The power level can be varied over a range of 35 dB by tuning the drain-source voltage. A hysteretic behavior in the frequency versus the drain-source voltage characteristic has been observed when the drain-source voltage exceeds a device-dependent level. This effect is attributed to the trapping of hot electrons in the drain region. By varying the gate-source voltage, the frequency can be only tuned over a range of 0.8 MHz at 4.2 K. At a gate-source voltage of 0 V, higher harmonics are generated. A phase noise reduction of 22 dB at a frequency offset of 50 kHz from the carrier can be obtained by cooling to 4.2 K and a feedback network consisting of copper layers.<>
Keywords :
III-V semiconductors; Schottky gate field effect transistors; cryogenics; gallium arsenide; hot carriers; microwave integrated circuits; microwave oscillators; semiconductor device noise; strip line components; tuning; 300 K; 4.2 K; GaAs; Josephson voltage standards; MESFET oscillator; MIC; conversion efficiency; cooling; drain-source voltage; frequency tuning; gate-source voltage; hot electrons; hysteretic behavior; phase noise; potentiometers; power leveling capability; stripline X-band oscillator; trapping; Frequency; Gallium arsenide; MESFETs; Packaging; Phase noise; Potentiometers; Stripline; Tuning; Voltage; Voltage-controlled oscillators;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233493
Filename :
233493
Link To Document :
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