DocumentCode :
941496
Title :
Microwave losses in kinetic-inductance devices fabricated from NbCN/MgO/NbCN trilayers
Author :
Carroll, K.R. ; Pond, J.M. ; Cukauskas, E.J.
Author_Institution :
US Naval Res. Lab., Washington, DC, USA
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
2808
Lastpage :
2811
Abstract :
The microwave losses in kinetic-inductance devices fabricated from NbCN/MgO/NbCN trilayers are being investigated. The loss tangent of an amorphous MgO thin film has been measured for frequencies near 10 GHz with a kinetic-inductance stub filter. The value of 0.0031 represents a factor of approximately 3 improvement over Si:H films found for a similar kinetic-inductance structure operating in a similar frequency range. Further improvement in the dielectric is also discussed. Other properties of the superconducting trilayer structure are consistent with previous results.<>
Keywords :
dielectric losses; magnesium compounds; microstrip components; microwave filters; niobium compounds; passive filters; superconducting junction devices; superconducting microwave devices; 10 GHz; NbCN-MgO-NbCN trilayers; SHF; SIS structure; amorphous MgO thin film; dielectric; kinetic-inductance devices; loss tangent; microwave losses; stub filter; superconducting trilayer structure; Amorphous materials; Dielectric loss measurement; Dielectric measurements; Dielectric thin films; Frequency measurement; Loss measurement; Microwave devices; Superconducting films; Superconducting filters; Superconducting microwave devices;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233498
Filename :
233498
Link To Document :
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