• DocumentCode
    941618
  • Title

    Dual exchange biased NiFe-TbCo unshielded MR heads for high density recording

  • Author

    Cain, William C. ; Markham, David C. ; Kryder, Mark H.

  • Author_Institution
    Magnetics Technol. Center, Carnegie Mellon Univ., Pittsburgh, PA, USA
  • Volume
    25
  • Issue
    5
  • fYear
    1989
  • fDate
    9/1/1989 12:00:00 AM
  • Firstpage
    3695
  • Lastpage
    3697
  • Abstract
    Narrow-trackwidth unshielded MR (magnetoresistive) heads with both longitudinal and transverse bias supplied by a single TbCo exchange-bias layer were constructed. These preliminary dual-biased NiFe-TbCo MR heads exhibit Barkhausen-noise-free, low-distortion response characteristics over a wide range of recording densities (up to 80 kFCI). A 64-μm track width, 7-μm height dual-exchange-biased element exhibited a phase margin of 50% at a raw bit error rate of 10-5 in a recording channel reproducing (1,7)-coded data written at 40 kFCI (54 kbPI) using compact spectrum write equalization. These exchange-biased head response data compare favorably to data obtained from an unshielded MR head biased by external permanent magnets. The dual-exchange-biased NiFe-TbCo MR heads exhibit a small dependence of bias on temperature (0.3% reduction per °C) and a small reduction in signal (1.3 dB) due to the shunting effect of the TbCo
  • Keywords
    cobalt alloys; iron alloys; magnetic heads; magnetic recording; magnetoresistance; nickel alloys; terbium alloys; 64 micron; 7 micron; Barkhausen-noise-free; NiFe-TbCo; compact spectrum write equalization; exchange-biased head response; high density recording; low-distortion response characteristics; single TbCo exchange-bias layer; transverse bias; Contacts; Demagnetization; Helium; Magnetic heads; Magnetic noise; Magnetic recording; Magnetic sensors; Permanent magnets; Sensor phenomena and characterization; Temperature sensors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.42404
  • Filename
    42404