DocumentCode :
941622
Title :
Analyzing the effect of the phase-jitter in the operation of second order phase-locked loops
Author :
Piqueira, J.R.C. ; Takada, E.Y. ; Monteiro, L.H.A.
Author_Institution :
Dept. de Engenharia de Telecomunicoe Controle, Univ. de Sao Paulo, Brazil
Volume :
52
Issue :
6
fYear :
2005
fDate :
6/1/2005 12:00:00 AM
Firstpage :
331
Lastpage :
335
Abstract :
Phase-locked loops (PLLs) are designed to extract timing signals in telecommunication networks. Noise, cross-talk, inter-symbol interference, quantization noise, and signal distortion are responsible for oscillations in the time between two successive transitions of the clock or data signal. It appears as an accidental phase modulation superposed to the original signal. This phenomenon is called timing jitter and affects the integrity of the data recovering process and, as a consequence, the error bit rate is increased. This problem has been studied by treating the jitter as a band limited noise process and tolerance masks for the jitter amplitude and frequency are recommended for several network architectures. Here, we develop a simple model with the continuous phase deviations of the clock signals considered as periodic signals in the band of the real disturbances. Comparisons with the stochastic approach are presented.
Keywords :
phase locked loops; phase modulation; quantisation (signal); synchronisation; timing jitter; accidental phase modulation; asymptotic approximation; clock signal; cross-talk; data recovering process; error bit rate; intersymbol interference; phase-jitter effect analysis; quantization noise; second order phase-locked loops; signal distortion; timing jitter; timing signal extraction; Clocks; Crosstalk; Data mining; Distortion; Interference; Jitter; Phase locked loops; Quantization; Signal design; Timing; Asymptotic approximation; phase jitter; phase-locked loops(PLLs); synchronization; synchronous state;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2005.848991
Filename :
1453748
Link To Document :
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