• DocumentCode
    942107
  • Title

    Direct detection at FIR frequencies with niobium tunnel junctions

  • Author

    Prince, J.D. ; Deaver, B.S., Jr. ; Withington, S.

  • Author_Institution
    Dept. of Phys., Virginia Univ., Charlottesville, VA, USA
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    2257
  • Lastpage
    2260
  • Abstract
    Measurements have been made on an array of six niobium/aluminum-aluminum oxide/niobium junctions with an integrated bow-tie antenna at 584 GHz. These measurements include examining the response of current-voltage curves at different incident radiation powers, both with and without an applied magnetic field. The measurements also include the responsivity and the noise of the devices as direct detectors. A planar superconducting quantum interference device (SQUID) was used as the low-frequency amplifier, and a chopped far infrared (FIR) laser generated the radiation. Comparisons with theoretical predictions show good fits to the current-voltage curves, except at the highest powers where there is evidence of heating and possibly nonequilibrium processes. Current responsivities of greater than one-half of the quantum limit and a noise equivalent power of 2*10/sup 1-4/ W/ square root Hz have been obtained.<>
  • Keywords
    SQUIDs; infrared detectors; microwave antennas; microwave detectors; niobium; superconducting junction devices; superconducting microwave devices; type II superconductors; 584 GHz; Nb tunnel junctions; applied magnetic field; current-voltage curves; direct detection; far infrared frequencies; integrated bow-tie antenna; low-frequency amplifier; noise; nonequilibrium processes; planar SQUID; responsivity; Antenna arrays; Antenna measurements; Current measurement; Finite impulse response filter; Frequency; Low-frequency noise; Magnetic field measurement; Niobium; SQUIDs; Superconducting device noise;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233554
  • Filename
    233554