Experimental implications of intrinsic quasiparticle mechanisms of dissipation in the switching dynamics of Josephson devices

Author

Ruggiero, B. ; Silvestrini, P.

Author_Institution

Istituto di Cibernetica del Consiglio Nazionale delle Ricerche, Arco Felice, Italy

Volume

3

Issue

1

fYear

1993

fDate

3/1/1993 12:00:00 AM

Firstpage

2226

Lastpage

2229

Abstract

The decay of the zero-voltage state is studied, including quasi-particle tunneling and the interference cos phi term in the equivalent circuit model. As a result of the approach used, the effective resistance for describing the junction dissipation, which was an arbitrary parameter in the resistively shunted junction (RSJ) model, can now be obtained in terms of the measurable junction parameters and bias conditions. This allows a direct comparison of data with theory. The very good agreement between data and theory confirms the essential correctness of the authors´ assumptions. The data also provide an excellent experimental test of the thermal activation theory in underdamped physical systems.<>

Keywords

Josephson effect; equivalent circuits; quasi-particles; superconducting junction devices; switching; Josephson devices; bias conditions; decay; dissipation; effective resistance; equivalent circuit model; intrinsic quasiparticle mechanisms; quasi-particle tunneling; resistively shunted junction model; switching dynamics; thermal activation theory; underdamped physical systems; zero-voltage state; Electrical resistance measurement; Equivalent circuits; Interference; Josephson junctions; Metastasis; Superconducting device noise; Superconducting devices; Thermal resistance; Tunneling; Voltage;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/77.233562

Filename

233562