DocumentCode :
942203
Title :
Hysteretic Josephson junctions from high T/sub c/ superconducting thin films
Author :
Fink, R.L. ; Thompson, M. ; Hilbert, C. ; Kroger, H.
Author_Institution :
Microelectronics & Comput. Technol. Corp., Austin, TX, USA
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
2219
Lastpage :
2221
Abstract :
Hysteretic superconductor-insulator-superconductor (SIS) and superconductor-normal metal-superconductor (SNS) Josephson junction devices have been fabricated from epitaxial thin-film structures. The SIS tunnel junctions were made of BKBO (Ba/sub 1-x/K/sub x/BiO/sub 3/) thin-film electrodes and a KNbO/sub 3/ barrier. Tunnel structures with gap voltages as high as 8 mV and switching voltages as high as 5 mV have been demonstrated. Nearly ideal SIS tunnel characteristics for high-temperature superconductive thin-film trilayer structures are reported. Zero bias currents are modulated by small magnetic fields and Shapiro steps are observed under RF-irradiation. SNS devices made from a YBCO (YBa/sub 2/Cu/sub 3/O/sub 7-y/) bottom thin-film electrode, a SrTiO/sub 3/ barrier, and a top BKBO film possessed McCumber parameters in excess of 100 and displayed I/sub c/R (critical-current resistance) products of up to 1 mV at 4.2 K.<>
Keywords :
Josephson effect; critical currents; high-temperature superconductors; magnetic hysteresis; superconducting epitaxial layers; superconducting junction devices; Ba/sub 1-x/K/sub x/BiO/sub 3/ electrodes; KNbO/sub 3/ barrier; McCumber parameters; Shapiro steps; SrTiO/sub 3/ barrier; T/sub c/ superconducting thin films; YBa/sub 2/Cu/sub 3/O/sub 7-y/ electrode; critical current-resistance product; epitaxial thin-film structures; gap voltages; hysteretic Josephson junctions; superconductor-insulator-superconductor; superconductor-normal metal-superconductor; switching voltages; tunnel junctions; Electrodes; High temperature superconductors; Hysteresis; Josephson junctions; Superconducting devices; Superconducting epitaxial layers; Superconducting thin films; Superconductivity; Thin film devices; Voltage;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233564
Filename :
233564
Link To Document :
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