DocumentCode
942397
Title
Reliability of Quantity Produced Transistors in Low Power Audio Applications
Author
Dukat, F.M.
Author_Institution
Raytheon Manufacturing Company, Newton, Massachusetts
fYear
1954
Firstpage
32
Lastpage
39
Keywords
Auditory system; Cities and towns; Encapsulation; Failure analysis; Humidity measurement; Manufacturing; Plastics; Power system reliability; Temperature distribution; Testing;
fLanguage
English
Journal_Title
Reliability and Quality Control, Transactions of the IRE Professional Group on
Publisher
ieee
Type
jour
DOI
10.1109/IRE-PGQC.1954.5007119
Filename
5007119
Link To Document