Title :
Reliable Electronics Through Protective Coating Techniques
Author :
Gamson, E.R. ; Henesian, A.
Author_Institution :
Stanford Research Institute, Stanford, California
Keywords :
Coatings; Conducting materials; Dielectric materials; Electric shock; Electronic equipment; Electronic equipment testing; Laboratories; Materials testing; Protection; Temperature;
Journal_Title :
Reliability and Quality Control, Transactions of the IRE Professional Group on
DOI :
10.1109/IRE-PGQC.1954.5007120
