DocumentCode

942483

Title

Reliability Indices for Missile Electronic Component Parts

Author

Bills, Thomas S.

Author_Institution

Applied Physics Laboratory, The Johns Hopkins University, Silver Spring, Maryland

fYear

1957

fDate

6/1/1957 12:00:00 AM

Firstpage

1

Lastpage

8

Keywords

Capacitors; Circuits; Electron tubes; Electronic components; Failure analysis; Laboratories; Missiles; Physics; Relays; Resistors;

fLanguage

English

Journal_Title

Reliability and Quality Control, IRE Transactions on

Publisher

ieee

ISSN

0097-4552

Type

jour

DOI

10.1109/IRE-PGRQC.1957.5007128

Filename

5007128