DocumentCode :
942495
Title :
Surface resistance of epitaxial and polycrystalline NbCN films in submillimeter wave region
Author :
Kohjiro, S. ; Kiryu, S. ; Shoji, A.
Author_Institution :
Electrotech. Lab., Ibaraki, Japan
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
1765
Lastpage :
1767
Abstract :
Surface resistances, R/sub s/´s, of epitaxial and polycrystalline NbCN films in submillimeter-wave region were evaluated from measurements of Fiske-resonant modes in Josephson tunnel junctions. It is found that epitaxial NbCN films have about one order of magnitude smaller R/sub s/ values than those for polycrystalline NbCN films. It is also found that the frequency dependence of R/sub s/ of epitaxial and polycrystalline NbCN films can be explained by the two-fluid model.<>
Keywords :
Josephson effect; niobium compounds; penetration depth (superconductivity); sputtered coatings; superconducting epitaxial layers; superconducting junction devices; superconducting thin films; surface conductivity; type II superconductors; Fiske-resonant modes; Josephson tunnel junctions; NbCN-MgO-NbCN epitaxial junction; frequency dependence; penetration depth; polycrystalline film; sputter deposition; submillimeter-wave region; surface resistance; two-fluid model; Electrical resistance measurement; Electrodes; Frequency dependence; Magnetic films; Magnetic resonance; Submillimeter wave measurements; Substrates; Surface resistance; Surface waves; Voltage;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233592
Filename :
233592
Link To Document :
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