DocumentCode
942500
Title
Topology of Switching Elements vs. Reliability
Author
Lipp, James P.
Author_Institution
General Electric Company, Advanced Electronics Center at Cornell University, Ithaca, New York
fYear
1957
fDate
6/1/1957 12:00:00 AM
Firstpage
21
Lastpage
33
Abstract
The topology of switching elements is explored from a probability or reliability standpoint. Arrays are indicated which offer a greater degree of reliability than any one of their elements, hence disproving the belief that circuit complexity necessarily lessens reliability. A further result is production of a simple mathematical technique adaptable to the solution of complex circuits in terms of reliability. Such ``circuits´´ may actually consist of redundant communication paths as a more general interpretation of switching elements.
Keywords
Assembly; Circuit topology; Communication switching; Complex networks; Complexity theory; Feeds; Information geometry; Production; Switches; Switching circuits;
fLanguage
English
Journal_Title
Reliability and Quality Control, IRE Transactions on
Publisher
ieee
ISSN
0097-4552
Type
jour
DOI
10.1109/IRE-PGRQC.1957.5007130
Filename
5007130
Link To Document