Title :
Factors in the Reliability of Germanium Power Transistors
Author :
Jacobsen, Andrew B.
Author_Institution :
Motorola, Inc., Phoenix, Arizona
fDate :
6/1/1957 12:00:00 AM
Keywords :
Assembly; Costs; Germanium; Manufacturing; Materials reliability; Materials testing; Power transistors; Slabs; Temperature; Voltage;
Journal_Title :
Reliability and Quality Control, IRE Transactions on
DOI :
10.1109/IRE-PGRQC.1957.5007132
