DocumentCode

942539

Title

Success Story - Transistor Reliability - 1956

Author

Zierdt, C.H., Jr.

Author_Institution

General Electric Company, Syracuse, New York

fYear

1957

fDate

6/1/1957 12:00:00 AM

Firstpage

57

Lastpage

68

Keywords

Atmosphere; Degradation; Electric variables; Feedback circuits; Germanium; Manufacturing industries; Production; Quality control; Silicon; Testing;

fLanguage

English

Journal_Title

Reliability and Quality Control, IRE Transactions on

Publisher

ieee

ISSN

0097-4552

Type

jour

DOI

10.1109/IRE-PGRQC.1957.5007134

Filename

5007134