Title :
Model for the excitation of 1/f noise by high-frequency a.c. signals
Author :
van Helvoort, G.J.M. ; Beck, H.G.E.
Author_Institution :
Eindhoven University of Technology, Department of Electrical Engineering, Eindhoven, Netherlands
Abstract :
A model is presented for the excitation of 1/f noise in carbon and semiconductor resistors by high-frequency a.c. signals. The model does not require special theories on 1/f noise; the observed 1/f noise is attributed, as usual, to resistance fluctuations.
Keywords :
electron device noise; random noise; resistors; 1/f noise; C resistors; high frequency AC signals; semiconductor resistors;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19770390
