• DocumentCode
    942850
  • Title

    Three-dimensional simulation of multistage depressed collectors on micro-computers

  • Author

    Kumar, Lalit ; Spidtke, P. ; Carter, R.G. ; Perring, D.

  • Author_Institution
    Microwave Tubes Area, Central Electron. Eng. Res. Inst., Pilani, India
  • Volume
    42
  • Issue
    9
  • fYear
    1995
  • fDate
    9/1/1995 12:00:00 AM
  • Firstpage
    1663
  • Lastpage
    1673
  • Abstract
    A three-dimensional (3-D) package for simulation of asymmetric and crossed-field multistage depressed collectors for microwave tubes has been developed. This package is based upon the 3-D finite-difference code KOBRA3-INP. The main features of the package are a user-friendly input interface, post-processors for collector analysis and calculation of secondary electron trajectories, and versatile output graphics. Both PC and mainframe versions of the package have been developed. The results of simple benchmark tests and those of simulation and analysis of asymmetric and crossed-field collectors including the effects of secondary electrons are presented. It is found that the asymmetric hyperbolic electric field collector shows very low backstreaming. It is shown that the representation of trajectories in energy space gives a better insight into the behavior of individual trajectories than plotting in coordinate space. The package will be useful for designing novel types of depressed collector
  • Keywords
    digital simulation; electronic engineering computing; finite difference methods; microwave tubes; 3-D finite-difference code; KOBRA3-INP; asymmetric collectors; backstreaming; crossed-field collectors; hyperbolic electric field; input interface; micro-computers; microwave tubes; multistage depressed collectors; output graphics; post-processors; secondary electron trajectories; three-dimensional simulation; Design optimization; Electrons; Finite difference methods; Geometry; Magnetic fields; Microcomputers; Packaging; Particle beams; Space technology; Transmitters;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.405282
  • Filename
    405282