Title :
Reliabllity Techniques for Electronic Circuit Design
Author :
Hellerman, L. ; Racite, M.P.
Author_Institution :
Product Development Laboratory, International Business Machines Corporation, Poughkeepsie, New York
Keywords :
Design engineering; Electronic circuits; Laboratories; Probability; Product development; Random variables; Reliability engineering; Sampling methods; Statistical distributions; Switching circuits;
Journal_Title :
Reliability and Quality Control, IRE Transactions on
DOI :
10.1109/IRE-PGRQC.1958.5007177
