DocumentCode :
942983
Title :
Laser-induced line melting and cutting
Author :
Cohen, Simon S. ; Bernstein, Joseph B. ; Wyatt, Peter W.
Author_Institution :
MIT Lincoln Lab., Lexington, MA, USA
Volume :
39
Issue :
11
fYear :
1992
fDate :
11/1/1992 12:00:00 AM
Firstpage :
2480
Lastpage :
2485
Abstract :
The application of pulsed laser radiation in the melting and cutting of VLSI conducting lines is studied. These processes are used to realize both deletive and additive redundancy techniques, common in defect avoidance and customization processes. The authors discuss the theory of laser-beam application of aluminum lines, and show how the various beam and substrate parameters affect the properties of the irradiated zone. Closed-form analytical expression have been obtained for the relevant quantities. No adjustable parameters are involved in the calculation of the various thermal properties. An analytical examination of the resulting molten zone properties has been performed in order to fully quantify the use of laser melting in customization and wafer-scale applications. The experimental results compare well with the theoretical predictions
Keywords :
VLSI; laser beam applications; redundancy; Al lines; additive redundancy; analytical expression; customization processes; defect avoidance; experimental results; laser line cutting; laser line joining; laser line melting; laser linking; laser melting; pulsed laser radiation; repair; wafer-scale applications; Additives; Electrons; Equations; Integrated circuit interconnections; Laser applications; Laser beam cutting; Laser modes; Laser theory; Optical pulses; Wire;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.163461
Filename :
163461
Link To Document :
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