• DocumentCode
    942991
  • Title

    Comments on "Threshold voltage model for deep-submicrometer MOSFETs

  • Author

    Iníguez, Benjamín

  • Author_Institution
    Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
  • Volume
    42
  • Issue
    9
  • fYear
    1995
  • Firstpage
    1712
  • Abstract
    For the original article see ibid., vol. 40, no. 1, p. 86-94 (1993). From the analytical solution of Poisson´s equation in the depletion layer of a MOSFET in weak inversion, the commenter finds an exact expression of the threshold voltage, valid for all drain biases and channel lengths (if they are greater than the minimum acceptable value) using the same procedure as in the aforementioned paper by Z.-H. Liu et al.<>
  • Keywords
    MOSFET; semiconductor device models; Poisson equation; deep-submicron MOSFET; depletion layer; threshold voltage model; weak inversion; MOSFETs; Physics; Poisson equations; Threshold voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.405294
  • Filename
    405294