DocumentCode
942991
Title
Comments on "Threshold voltage model for deep-submicrometer MOSFETs
Author
Iníguez, Benjamín
Author_Institution
Dept. of Phys., Balearic Islands Univ., Palma de Mallorca, Spain
Volume
42
Issue
9
fYear
1995
Firstpage
1712
Abstract
For the original article see ibid., vol. 40, no. 1, p. 86-94 (1993). From the analytical solution of Poisson´s equation in the depletion layer of a MOSFET in weak inversion, the commenter finds an exact expression of the threshold voltage, valid for all drain biases and channel lengths (if they are greater than the minimum acceptable value) using the same procedure as in the aforementioned paper by Z.-H. Liu et al.<>
Keywords
MOSFET; semiconductor device models; Poisson equation; deep-submicron MOSFET; depletion layer; threshold voltage model; weak inversion; MOSFETs; Physics; Poisson equations; Threshold voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.405294
Filename
405294
Link To Document