• DocumentCode
    943108
  • Title

    Influence of structure of fine filament NbTi composite on its electromagnetic characteristics

  • Author

    Hlasnik, I. ; Tsukamoto, O. ; Fukui, S. ; Kumano, T. ; Polak, M. ; Kokavec, J. ; Majoros, Milan ; Krempasky ; Suzuki, E.

  • Author_Institution
    Div. of Electr. & Comput. Eng., Yokohama Nat. Univ., Yokohama, Japan
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    1370
  • Lastpage
    1373
  • Abstract
    The study of the influence of filament diameter d/sub f/, filament spacing b/sub n/, and B on critical current density J/sub c/ and AC losses p/sub s/ in one type of fine filament composite (FFC) has revealed two components of J/sub c/, the bulk and surface critical current densities J/sub cb/ and J/sub cs/, respectively. A simple relationship between them, J/sub c/, and geometrical parameters of FFC including those with different types of artificial pinning centers (APCs) is formulated. It is used to explain measured J/sub c/(B,d/sub f/) dependence in FFC with island-type APC as well as to discuss the prospects of both types of APC in FFC for AC use. To verify the theoretical results, a series of FFC samples with sheet-type APC has been prepared and measured. Experimental values of J/sub c/(B,d/sub f/) obtained in this series of samples are smaller than expected. One possible reason for this difference is suggested.<>
  • Keywords
    composite superconductors; critical current density (superconductivity); flux pinning; niobium alloys; titanium alloys; type II superconductors; AC losses; artificial pinning centers; critical current density; electromagnetic characteristics; filament diameter; filament spacing; fine filament NbTi composite; geometrical parameters; structure; AC machines; Compaction; Critical current density; Current density; Frequency; Modems; Multifilamentary superconductors; Niobium compounds; Titanium compounds; Wire;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233644
  • Filename
    233644