Title :
Efficient modeling of 1/f/sup /spl alpha// noise using multirate process
Author :
Park, Jongsun ; Muhammad, Khurram ; Roy, Kaushik
Author_Institution :
Marvell Semicond. Inc., Santa Clara, CA
fDate :
7/1/2006 12:00:00 AM
Abstract :
In order to verify the system performance of mixed-signal systems on chip (SoCs), computer-aided design (CAD) tools are required to generate 1/falpha noise that degrades the performance of most analog circuits. Current techniques for generating discrete sequences of 1/falpha noise require a large amount of computations that place an excessive burden on the computation engine and random number generators. In this paper, the authors propose a low-complexity 1/falpha noise generation scheme, which is based on a multirate filter bank. In this scheme, each branch in the filter bank processes signals in a different frequency band while allowing for arbitrary selection of alpha in each bank. The proposed approach greatly reduces computations when compared to traditional noise generation processes of using a single noise-shaping filter. Furthermore, it allows selecting different combinations of noise frequency response in different frequency bands, thus allowing calibration of noise generated in simulation to the one measured in the laboratory from test chips. A comparison of various noise generation schemes is also presented
Keywords :
1/f noise; channel bank filters; integrated circuit modelling; integrated circuit noise; mixed analogue-digital integrated circuits; system-on-chip; 1-f noise modeling; computer-aided design; flicker noise; frequency response; mixed signal systems; mixed-signal system on chip; multirate filter bank; multirate process; noise generation; noise-shaping filter; Analog circuits; Circuit noise; Degradation; Design automation; Filter bank; Frequency; Noise generators; Random number generation; System performance; System-on-a-chip; Flicker noise; mixed signal systems; multirate filter banks; noise modeling;
Journal_Title :
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
DOI :
10.1109/TCAD.2005.855953