DocumentCode :
943136
Title :
Characterization and coil test results for a multifilamentary NbTi conductor utilizing artificial pinning center technology
Author :
Scanlan, R.M. ; Dietderich, D.R. ; McManaman, P. ; Ghiorso, W.
Author_Institution :
Lawrence Berkeley Lab., CA, USA
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
1358
Lastpage :
1361
Abstract :
The introduction of pinning centers via the controlled addition of a second phase, with the correct size and spacing, has been proposed as a method for producing a material with optimum flux pinning and hence a higher critical current density in practical superconductors. The demonstration of such artificial pinning center (APC) materials has been the aim of recent collaborative efforts with several US manufacturers. This paper reports the coil test results for a multifilamentary NbTi conductor fabricated using an APC technique. The conductor showed improved performance compared to earlier APC conductors, and its performance is comparable to that found in conventional multifilamentary NbTi conductors. In addition to coil test results. results of low-field magnetization, scanning electron microscopy (SEM), and transmission electron microscopy (TEM) are reported and compared with similar results on conventional NbTi.<>
Keywords :
composite superconductors; critical current density (superconductivity); flux pinning; niobium alloys; superconducting magnets; titanium alloys; type II superconductors; NbTi; artificial pinning center technology; coil test; higher critical current density; low-field magnetization; multifilamentary NbTi conductor; optimum flux pinning; scanning electron microscopy; transmission electron microscopy; Conducting materials; Magnetic force microscopy; Niobium compounds; Scanning electron microscopy; Size control; Superconducting coils; Superconducting materials; Testing; Titanium compounds; Transmission electron microscopy;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233647
Filename :
233647
Link To Document :
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