Title :
Specific boundary resistance in Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7-x//Au thin-film bilayer
Author :
Smirnov, D.R. ; Snigirev, O.V. ; Yakunin, V.G.
Author_Institution :
Dept. of Phys., Moscow State Univ., Russia
fDate :
3/1/1993 12:00:00 AM
Abstract :
The specific boundary resistance R/sub b/ of the Y/sub 1/Ba/sub 2/Cu/sub 3/O/sub 7-x//Au thin-film bilayer has been studied. Reduction of R/sub b/ from an initial value close to 10/sup -5/ Omega -cm/sup 2/ to approximately 10/sup -10/ Omega -cm/sup 2/ was observed after annealing in oxygen at 500 degrees C. The magnitude of the parameter upsilon /sub b/ varies as R/sub b/, which characterizes the value of the order parameter discontinuity across the S-N interface, was less than 100. After oxygen annealing a high level of diffusion of Ba and Cu atoms in the Au film was found by Auger spectroscopy.<>
Keywords :
Auger effect; barium compounds; gold; high-temperature superconductors; superconductive tunnelling; yttrium compounds; Auger spectroscopy; S-N interface; YBa/sub 2/Cu/sub 3/O/sub 7-x/-Au; diffusion; high temperature superconductor; specific boundary resistance; thin-film bilayer; Annealing; Contact resistance; Electrical resistance measurement; Fabrication; Gold; High temperature superconductors; Physics; Tin; Transistors; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
