DocumentCode :
943378
Title :
Failure Analysis of Failure Analyses: The Rules of the Rue Morgue, Ten Years Later
Author :
Mura, Giovanna ; Vanzi, Massimo
Author_Institution :
Univ. of Cagliari, Cagliari
Volume :
7
Issue :
3
fYear :
2007
Firstpage :
446
Lastpage :
452
Abstract :
When device customers delegate the failure analysis (FA) of field returns to a third party or, sometimes, to the manufacturer of the device, the resultant final FA reports are frequently unsatisfactory. In this paper, we investigate the reasons for this unsatisfactory outcome using three real case studies as examples. A paper of a decade ago, which proposed equivalent rules for a crime investigation and a tricky FA, is recalled. In that paper, some cardinal logical violations to those rules were identified as the most recurrent flaws in FA reports.
Keywords :
Schottky diodes; failure analysis; fault diagnosis; insulated gate bipolar transistors; semiconductor device reliability; Rue Morgue; Schottky diode; cardinal logical violations; crime investigation; failure analysis; fault diagnosis; insulated gate bipolar transistor; microcomputer; Failure Analysis; Failure analysis (FA); Fault Diagnosis; Insulated Gate Bipolar Transistor; Microcomputer; Schottky diode; Schottky diode.; fault diagnosis; insulated gate bipolar transistor; microcomputer;
fLanguage :
English
Journal_Title :
Device and Materials Reliability, IEEE Transactions on
Publisher :
ieee
ISSN :
1530-4388
Type :
jour
DOI :
10.1109/TDMR.2007.907428
Filename :
4358697
Link To Document :
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