DocumentCode :
943619
Title :
The Effect of the NOL and Battelle Data Interchange Programs on Librascope Reliability Test Efforts
Author :
Rado, Leonard G.
Author_Institution :
Librascope Div., General Precision, Inc., Glendale, Calif.
Issue :
1
fYear :
1961
fDate :
3/1/1961 12:00:00 AM
Firstpage :
26
Lastpage :
28
Abstract :
Due to the emphasis placed on the interchange of test data and also on the attempt to give the defense effort the best possible test information, two particular programs have been promulgated: The NOL Component Reliability History Program (FBMWS) and the efforts of the Battelle Memorial Institute´s Electronic Component Research Center which have been in existence for several years now. This paper describes the different aspects of each program and the mechanics of each. The NOL Program is for the use of Fleet Ballistic Missile Weapons System (FBMWS) contractors and the Battelle Program is funded by contributions of the members. This paper also indicates how Librascope, as a participating member with a small evaluation group, gleans the most results from membership in these two programs.
Keywords :
Corona; Electronic components; Electronic equipment testing; Government; History; Missiles; Quality control; Senior members; System testing; Weapons;
fLanguage :
English
Journal_Title :
Reliability and Quality Control, IRE Transactions on
Publisher :
ieee
ISSN :
0097-4552
Type :
jour
DOI :
10.1109/IRE-PGRQC.1961.5007251
Filename :
5007251
Link To Document :
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