• DocumentCode
    943619
  • Title

    The Effect of the NOL and Battelle Data Interchange Programs on Librascope Reliability Test Efforts

  • Author

    Rado, Leonard G.

  • Author_Institution
    Librascope Div., General Precision, Inc., Glendale, Calif.
  • Issue
    1
  • fYear
    1961
  • fDate
    3/1/1961 12:00:00 AM
  • Firstpage
    26
  • Lastpage
    28
  • Abstract
    Due to the emphasis placed on the interchange of test data and also on the attempt to give the defense effort the best possible test information, two particular programs have been promulgated: The NOL Component Reliability History Program (FBMWS) and the efforts of the Battelle Memorial Institute´s Electronic Component Research Center which have been in existence for several years now. This paper describes the different aspects of each program and the mechanics of each. The NOL Program is for the use of Fleet Ballistic Missile Weapons System (FBMWS) contractors and the Battelle Program is funded by contributions of the members. This paper also indicates how Librascope, as a participating member with a small evaluation group, gleans the most results from membership in these two programs.
  • Keywords
    Corona; Electronic components; Electronic equipment testing; Government; History; Missiles; Quality control; Senior members; System testing; Weapons;
  • fLanguage
    English
  • Journal_Title
    Reliability and Quality Control, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0097-4552
  • Type

    jour

  • DOI
    10.1109/IRE-PGRQC.1961.5007251
  • Filename
    5007251