Title :
Interval Estimation of Product Reliability by Use of the Noncentral t Distribution
Author_Institution :
Semiconductor Div., Hughes Products, Culver City, Calif.
fDate :
4/1/1960 12:00:00 AM
Keywords :
Arithmetic; Circuits; Electronic components; Error analysis; Gaussian distribution; Maintenance; Redundancy; Sampling methods; Statistical distributions; Testing;
Journal_Title :
Reliability and Quality Control, IRE Transactions on
DOI :
10.1109/IRE-PGRQC.1960.5007270
