DocumentCode

943793

Title

Interval Estimation of Product Reliability by Use of the Noncentral t Distribution

Author

Schafer, R.E.

Author_Institution

Semiconductor Div., Hughes Products, Culver City, Calif.

Issue

1

fYear

1960

fDate

4/1/1960 12:00:00 AM

Firstpage

77

Lastpage

81

Keywords

Arithmetic; Circuits; Electronic components; Error analysis; Gaussian distribution; Maintenance; Redundancy; Sampling methods; Statistical distributions; Testing;

fLanguage

English

Journal_Title

Reliability and Quality Control, IRE Transactions on

Publisher

ieee

ISSN

0097-4552

Type

jour

DOI

10.1109/IRE-PGRQC.1960.5007270

Filename

5007270