Title :
Statistical Approach to Reliability Improvement of the Tantalum Capacitor
Author :
Demos, Nicholas P.
Author_Institution :
General Engrg. Lab. General Electric Co. Schenectady, N.Y.
Keywords :
Appraisal; Capacitors; Inspection; Laboratories; Manufacturing; Mathematical analysis; Missiles; Reliability engineering; Shafts; Testing;
Journal_Title :
Reliability and Quality Control, IRE Transactions on
DOI :
10.1109/IRE-PGRQC.1960.5007291
