• DocumentCode
    944122
  • Title

    New Autopsy Techniques for Transistors and Relays

  • Author

    Clark, C.B. ; Duffek, E.F.

  • Author_Institution
    Stanford Res. Inst., Menlo Park, Calif.
  • Issue
    3
  • fYear
    1960
  • Firstpage
    20
  • Lastpage
    22
  • Abstract
    A new method for opening hermetically-sealed metal cases is described. Instead of mechanically sawing or cutting the metal, an electrochemical process is used. Two methods are described, static electrolysis (anodic dissolution) and jet electrolysis. Examples of the application of these methods to the ``autopsy´´ of failed transistors with 6-mil Kovar shells and relays with 15-mil brass shells is shown.
  • Keywords
    Autopsy; Cathodes; Electric shock; Electrochemical processes; Filling; Quality control; Relays; Sawing; Steel; Wires;
  • fLanguage
    English
  • Journal_Title
    Reliability and Quality Control, IRE Transactions on
  • Publisher
    ieee
  • ISSN
    0097-4552
  • Type

    jour

  • DOI
    10.1109/IRE-PGRQC.1960.5007304
  • Filename
    5007304