Title :
New Autopsy Techniques for Transistors and Relays
Author :
Clark, C.B. ; Duffek, E.F.
Author_Institution :
Stanford Res. Inst., Menlo Park, Calif.
Abstract :
A new method for opening hermetically-sealed metal cases is described. Instead of mechanically sawing or cutting the metal, an electrochemical process is used. Two methods are described, static electrolysis (anodic dissolution) and jet electrolysis. Examples of the application of these methods to the ``autopsy´´ of failed transistors with 6-mil Kovar shells and relays with 15-mil brass shells is shown.
Keywords :
Autopsy; Cathodes; Electric shock; Electrochemical processes; Filling; Quality control; Relays; Sawing; Steel; Wires;
Journal_Title :
Reliability and Quality Control, IRE Transactions on
DOI :
10.1109/IRE-PGRQC.1960.5007304
