Title :
Complex Dielectric Constants for Selected Near-Millimeter-Wave Materials at 245 GHz
Author :
Dutta, J.M. ; Jones, C.R. ; Davé, H.
fDate :
9/1/1986 12:00:00 AM
Abstract :
A double-beam instrument developed in this laboratory has been used to measure the complex dielectric constant of selected materials at 245 GHz. We report here the results for crystalline quartz, fused silica (Spectrosil WF and Dynasil 4000), beryllia (iso-pressed),boron nitride (hot-pressed), and a nickel ferrite (Trans-Tech 2-111). Results are compared with the data obtained by other researchers.
Keywords :
Crystalline materials; Crystallization; Dielectric constant; Dielectric materials; Dielectric measurements; Ferrites; Instruments; Laboratories; Nickel; Silicon compounds;
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
DOI :
10.1109/TMTT.1986.1133473
