• DocumentCode
    944309
  • Title

    The Effect of Fringing Fields on the Resistance of a Conducting Film

  • Author

    Schwarzbek, Stephen M. ; Ruggiero, Steven T.

  • Volume
    34
  • Issue
    9
  • fYear
    1986
  • fDate
    9/1/1986 12:00:00 AM
  • Firstpage
    977
  • Lastpage
    981
  • Abstract
    We have calculated the effect of fringing fields on the measured resistance of a conducting film between two circular disks, using two complementary approaches, for a wide range of disk separations. The problem is cast as the numerical solution of a dual integral equation and a straightforward relaxation procedure for the isomorphic problem of the fringing effects on the capacitance of a circular disk between two grounded planes. These results also represent the solution for the capacitance in the high dielectric limit for two disks separated by a dielectric medium.
  • Keywords
    Capacitance; Conductive films; Conductivity; Dielectric measurements; Dielectric thin films; Electrical resistance measurement; Geometry; Integral equations; Laplace equations; Resistors;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.1986.1133479
  • Filename
    1133479