DocumentCode :
944309
Title :
The Effect of Fringing Fields on the Resistance of a Conducting Film
Author :
Schwarzbek, Stephen M. ; Ruggiero, Steven T.
Volume :
34
Issue :
9
fYear :
1986
fDate :
9/1/1986 12:00:00 AM
Firstpage :
977
Lastpage :
981
Abstract :
We have calculated the effect of fringing fields on the measured resistance of a conducting film between two circular disks, using two complementary approaches, for a wide range of disk separations. The problem is cast as the numerical solution of a dual integral equation and a straightforward relaxation procedure for the isomorphic problem of the fringing effects on the capacitance of a circular disk between two grounded planes. These results also represent the solution for the capacitance in the high dielectric limit for two disks separated by a dielectric medium.
Keywords :
Capacitance; Conductive films; Conductivity; Dielectric measurements; Dielectric thin films; Electrical resistance measurement; Geometry; Integral equations; Laplace equations; Resistors;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/TMTT.1986.1133479
Filename :
1133479
Link To Document :
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