DocumentCode :
944364
Title :
The reduction of the critical current in Nb/sub 3/Sn cables under transverse loads
Author :
van Oort, J.M. ; Scanlan, R.M. ; Weijers, H.W. ; Wessel, S. ; ten Kate, H.H.J.
Author_Institution :
Lawrence Berkeley Lab., CA, USA
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
559
Lastpage :
562
Abstract :
The degradation of the critical current of impregnated Rutherford type Nb/sub 3/Sn cables was investigated as a function of the applied transverse load and magnetic field. The cable is made of modified jelly-roll-type strand material and has a keystone angle of 1.0 degrees . The voltage-current characteristics were determined for the magnetic field ranging from 2 to 11 T and transverse pressure up to 250 MPa on the cable surface. It was found that the 48-strand cable, made of strands with six elements in the matrix, showed a larger critical current degradation than the 26-strand cable with 36 elements per strand. The global degradation of the 48-strand cable was 63% at 150 MPa, and 40% at 150 MPa for the 26-strand cable. Microanalysis of the cross-section before and after compression is presented, showing significant permanent damage to the superconducting strands.<>
Keywords :
beam handling equipment; composite superconductors; critical currents; niobium alloys; superconducting cables; superconducting magnets; tin alloys; 0 to 250 MPa; 2 to 11 T; Nb/sub 3/Sn cables; accelerator dipole magnets; applied transverse load; critical current; critical current degradation; cross-section microanalysis; impregnated Rutherford cables; jelly-roll-type strand material; keystone angle; magnetic field; superconducting strands; transverse pressure; voltage-current characteristics; Critical current; Current measurement; Degradation; Magnetic field measurement; Magnetic fields; Magnetic materials; Niobium; Superconducting cables; Superconducting magnets; Tin;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233767
Filename :
233767
Link To Document :
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