Author :
Pappas, Nicholas L.
Author_Institution :
Hewlett-Packard Company, Palo Alto, California
fDate :
4/1/1954 12:00:00 AM
Keywords :
Bandwidth; Crystals; Detectors; Directional couplers; Frequency estimation; Frequency measurement; Microwave devices; Microwave measurements; Reflection; Voltage;
Journal_Title :
Instrumentation, Transactions of the IRE Professional Group on
DOI :
10.1109/IREPG-I.1954.5007350
