مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

944543

Title :

They come from outer space

Author :

Evans-Pughe, Chris

Volume :

Issue :

fYear :

2003

Firstpage :

Lastpage :

Abstract :

Today, a system using hundreds of chips could suffer several soft error failures a month, and the problem is set to increase. Why is this and what are the implications?.

Keywords :

cosmic ray interactions; failure analysis; integrated circuit reliability; radiation effects; chips; cosmic ray interactions; integrated circuit reliability; outer space; radiation effects; soft error failures;

fLanguage :

English

Journal_Title :

IEE Review

Publisher :

iet

ISSN :

0953-5683

Type :

jour

DOI :

10.1049/ir:20030805

Filename :

1281289

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=944543