• DocumentCode
    944870
  • Title

    Cold work loss during heat treatment and extrusion of Nb-46.5 wt.% Ti composites as measured by microhardness

  • Author

    Parrell, J.A. ; Lee, P.J. ; Larbalestier, D.C.

  • Author_Institution
    Appl. Supercond. Center, Wisconsin Univ., Madison, WI, USA
  • Volume
    3
  • Issue
    1
  • fYear
    1993
  • fDate
    3/1/1993 12:00:00 AM
  • Firstpage
    734
  • Lastpage
    737
  • Abstract
    The authors utilized the simple technique of hardness measurement as a probe of the retained cold work in variously treated Nb-Ti monofilament rod stock, and they compare these results on extruded multifilament rod stock. In this experiment the cold work loss which occurs during monofilament heat treatment and multifilamentary extrusion was directly measured by comparing the Vickers hardness of the same Nb-46.5wt.%Ti alloy stock which had been cold drawn at room temperature, heat treated and cold drawn, and warm extruded. Depending on the strain state of the filaments prior to extrusion, a strain loss between 1.4 and 5.4 was determined in the extruded billet filaments. This is a very significant loss range given that the total strain space of most multifilamentary stacks lies in the range of 11-12.<>
  • Keywords
    composite superconductors; extrusion; hardness; heat treatment; niobium alloys; superconducting cables; superconducting magnets; titanium alloys; Nb-Ti; Vickers hardness; cold work loss; composites; extrusion; hardness measurement; heat treatment; loss range; microhardness; monofilament rod stock; multifilament rod stock; retained cold work; room temperature; strain loss; strain state; superconducting magnet cables; total strain space; Billets; Capacitive sensors; Critical current density; Fabrication; Flux pinning; Grain boundaries; Heat treatment; Loss measurement; Morphology; Multifilamentary superconductors;
  • fLanguage
    English
  • Journal_Title
    Applied Superconductivity, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1051-8223
  • Type

    jour

  • DOI
    10.1109/77.233808
  • Filename
    233808