Title :
20ps/Gate Gunn-effect high-speed carry finding device
Author :
Hashizume, Nobuo ; Kataoka, Shoei ; Tomizawa, Kazutaka
Author_Institution :
Electrotechnical Laboratory, Tokyo, Japan
Abstract :
Improvement was made on our recently reported Gunn-effect high-speed carry finding device, which can now perform logic operations with a minimum delay time of 20 ps/gate. The improvement is concerned with the means of nullifying the effect of the nonuniformity of the constituent m.e.s.f.e.t.s.
Keywords :
Gunn devices; field effect integrated circuits; integrated logic circuits; logic devices; 20 ps/gate delay time; Gunn devices; Gunn effect high speed carry finding device; logic devices;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19780062
