Title :
Nodal analysis of d.c. bias circuits
Author_Institution :
Private Address, Katowice, Poland
Abstract :
This paper deals with the nodal analysis of the effect of temperature variations upon electronic networks.
Keywords :
equivalent circuits; network analysis; semiconductor devices; DC bias circuits; electronic networks; nodal analysis; temperature variations;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19780093
