DocumentCode
945351
Title
Nodal analysis of d.c. bias circuits
Author
Witkowski, J.J.
Author_Institution
Private Address, Katowice, Poland
Volume
14
Issue
5
fYear
1978
Firstpage
137
Lastpage
139
Abstract
This paper deals with the nodal analysis of the effect of temperature variations upon electronic networks.
Keywords
equivalent circuits; network analysis; semiconductor devices; DC bias circuits; electronic networks; nodal analysis; temperature variations;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19780093
Filename
4240894
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