Title :
The effect of thickness of delta-strained Layers in the design of polarization-insensitive semiconductor optical amplifiers
Author :
Wartak, M.S. ; Weetman, P.
Author_Institution :
Dept. of Phys. & Comput. Sci., Wilfrid Laurier Univ., Waterloo, Ont., Canada
fDate :
4/1/2004 12:00:00 AM
Abstract :
We have analyzed the effect of thickness of delta (δ)-strained layer in the design of polarization insensitive semiconductor optical amplifiers. We considered a system consisting of a single quantum well (QW) with several different locations and varying thicknesses of δ layer. For its analysis, we used the self-consistent approach of solving the Poisson, Schrödinger, and 4 × 4 Lüttinger-Kohn equations. The many-body effects of bandgap renormalization, Coulombic scattering interactions, and a non-Markovian distribution were all included in the model. We have found that up to eight monolayers produce very good polarization insensitivity (<1 dB) provided that the δ layer is properly positioned inside QW. For a given thickness of δ layer, we also provide the location inside QW which gives the best polarization insensitivity.
Keywords :
Poisson equation; Schrodinger equation; semiconductor device models; semiconductor optical amplifiers; semiconductor quantum wells; 4×4 Luttinger-Kohn equation; Coulombic scattering interactions; Poisson equation; SOA; Schrodinger equation; bandgap renormalization; delta-strained layers; many-body effects; nonMarkovian distribution; polarization insensitivity; polarization-insensitive semiconductor optical amplifiers; quantum-well devices; single quantum well; strain; thickness; Optical design; Optical polarization; Optical scattering; Optical sensors; Particle scattering; Photonic band gap; Poisson equations; Schrodinger equation; Semiconductor optical amplifiers; Tellurium;
Journal_Title :
Photonics Technology Letters, IEEE
DOI :
10.1109/LPT.2004.824625