DocumentCode :
945623
Title :
Experimental evaluation of some rapid single flux quantum cells
Author :
Kwong, Y.K. ; Nandakumar, V.
Author_Institution :
Tektronix Inc., Beaverton, OR, USA
Volume :
3
Issue :
1
fYear :
1993
fDate :
3/1/1993 12:00:00 AM
Firstpage :
2666
Lastpage :
2670
Abstract :
Some basic cells in the rapid single-flux quantum (RSFQ) family of superconductive logic circuits were studied. An input stage, a buffer, and an OR gate were simulated and laid out for a standard niobium-based fabrication process. The resulting circuits perform properly for clock speeds up to 1 GHz. For the simpler circuits tested, the measured margins are wide, consistent with simulations, and not very dependent on clock speed. However, margin decreases with increased circuit complexity. The input stage converts a rising edge into an SFQ pulse, which has a small amplitude and narrow width in time. On the present circuits, these pulses are about 200 mu V in amplitude and 10 ps in width. To facilitate measurement, the authors have chosen as the output an asymmetrical superconducting quantum interference device (SQUID) consisting of two Josephson junctions. It converts SFQ pulses into 2.5 mV latching output levels on chip. By inductively coupling SFQ pulses into the SQUID loop, DC current isolation between the RSFQ circuit-under-test and the output stage is provided. The SQUID was optimized for 2 GHz operations.<>
Keywords :
Josephson effect; SQUIDs; buffer circuits; logic gates; superconducting logic circuits; 1 GHz; 2 GHz; DC current isolation; Josephson junctions; Nb based fabrication process; OR gate; SFQ pulse; SQUID loop; asymmetrical SQUID; buffer; input stage; rapid single flux quantum cells; superconducting quantum interference device; superconductive logic circuits; Circuit simulation; Circuit testing; Clocks; Fabrication; Josephson junctions; Logic circuits; Pulse circuits; SQUIDs; Space vector pulse width modulation; Superconductivity;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/77.233876
Filename :
233876
Link To Document :
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