DocumentCode
945623
Title
Experimental evaluation of some rapid single flux quantum cells
Author
Kwong, Y.K. ; Nandakumar, V.
Author_Institution
Tektronix Inc., Beaverton, OR, USA
Volume
3
Issue
1
fYear
1993
fDate
3/1/1993 12:00:00 AM
Firstpage
2666
Lastpage
2670
Abstract
Some basic cells in the rapid single-flux quantum (RSFQ) family of superconductive logic circuits were studied. An input stage, a buffer, and an OR gate were simulated and laid out for a standard niobium-based fabrication process. The resulting circuits perform properly for clock speeds up to 1 GHz. For the simpler circuits tested, the measured margins are wide, consistent with simulations, and not very dependent on clock speed. However, margin decreases with increased circuit complexity. The input stage converts a rising edge into an SFQ pulse, which has a small amplitude and narrow width in time. On the present circuits, these pulses are about 200 mu V in amplitude and 10 ps in width. To facilitate measurement, the authors have chosen as the output an asymmetrical superconducting quantum interference device (SQUID) consisting of two Josephson junctions. It converts SFQ pulses into 2.5 mV latching output levels on chip. By inductively coupling SFQ pulses into the SQUID loop, DC current isolation between the RSFQ circuit-under-test and the output stage is provided. The SQUID was optimized for 2 GHz operations.<>
Keywords
Josephson effect; SQUIDs; buffer circuits; logic gates; superconducting logic circuits; 1 GHz; 2 GHz; DC current isolation; Josephson junctions; Nb based fabrication process; OR gate; SFQ pulse; SQUID loop; asymmetrical SQUID; buffer; input stage; rapid single flux quantum cells; superconducting quantum interference device; superconductive logic circuits; Circuit simulation; Circuit testing; Clocks; Fabrication; Josephson junctions; Logic circuits; Pulse circuits; SQUIDs; Space vector pulse width modulation; Superconductivity;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/77.233876
Filename
233876
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