Title :
Properties of epitaxial YBa/sub 2/Cu/sub 3/O/sub y/ thin films on sapphire with PrBa/sub 2/Cu/sub 3/O/sub y/ buffer layers
Author :
Boffa, V. ; Paterno, G. ; Romeo, C. ; Rossi, V. ; Penna, M. ; Di Gioacchino, D. ; Gambardella, U. ; Barbanera, S. ; Murtas, F.
Author_Institution :
ENEA CRE-Frascati, Rome, Italy
fDate :
3/1/1993 12:00:00 AM
Abstract :
YBa/sub 2/Cu/sub 3/O/sub y/ epitaxial thin films have been grown on a PrBa/sub 2/Cu/sub 3/O/sub y/ layer deposited on a sapphire substrate, using XeCl excimer laser ablation for both depositions. The films were deposited in situ by means of a rotating multitarget system carrying the two targets. The substrate holder was heated by a CO/sub 2/ laser beam. The as-deposited films show a zero resistance critical temperature of 87 K and a high degree of epitaxiality with c-axis orientation. The samples have been patterned in the shape of strips of variable width between 10 mu m and 30 mu m. DC transport critical current densities for YBa/sub 2/Cu/sub 3/O/sub y/ grown on PrBa/sub 2/Cu/sub 3/O/sub y//Al/sub 2/O/sub 3/ have been measured as a function of the temperature and an applied magnetic field.<>
Keywords :
barium compounds; critical current density (superconductivity); high-temperature superconductors; laser ablation; superconducting epitaxial layers; superconducting transition temperature; vapour phase epitaxial growth; yttrium compounds; 10 to 30 micron; 87 K; Al/sub 2/O/sub 3/; DC transport critical current densities; XeCl excimer laser ablation; YBa/sub 2/Cu/sub 3/O/sub 7- delta /-PrBa/sub 2/Cu/sub 3/O/sub 7-y/Al/sub 2/O/sub 3/; applied magnetic field; buffer layers; c-axis orientation; epitaxial YBa/sub 2/Cu/sub 3/O/sub y/ thin films; epitaxiality; high temperature superconductors; rotating multitarget system; sapphire; strips; zero resistance critical temperature; Critical current density; Laser ablation; Laser beams; Magnetic field measurement; Molecular beam epitaxial growth; Shape; Sputtering; Strips; Substrates; Temperature;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
