• DocumentCode
    945719
  • Title

    Recovery Time Measurements on Point-Contact Germanium Diodes

  • Author

    Firle, T.E. ; McMahon, M.E. ; Roach, J.F.

  • Author_Institution
    Hughes Aircraft Co., Los Angeles, Calif.
  • Volume
    43
  • Issue
    5
  • fYear
    1955
  • fDate
    5/1/1955 12:00:00 AM
  • Firstpage
    603
  • Lastpage
    607
  • Abstract
    The use of point-contact diodes in computer circuitry has shown that diode transient response is important in circuitry employing fast waveforms. Diodes which are pulsed in the back direction from a forward-conducting state may require microseconds to attain a specified back resistance. Transient response depends on circuit impedance and operating conditions, as well as on the diodes themselves. The present lack of ready extrapolation from one transient situation to another requires different tests and criteria for the determination of diode applicability to varying situations. The development and acceptance of a limited number of broadly applicable standard pulse tests is necessary.
  • Keywords
    Circuit stability; Germanium; Impedance; RLC circuits; Resistors; Resonance; Resonant frequency; Semiconductor diodes; Time measurement; Transient response;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IRE
  • Publisher
    ieee
  • ISSN
    0096-8390
  • Type

    jour

  • DOI
    10.1109/JRPROC.1955.278105
  • Filename
    4055461