DocumentCode
945719
Title
Recovery Time Measurements on Point-Contact Germanium Diodes
Author
Firle, T.E. ; McMahon, M.E. ; Roach, J.F.
Author_Institution
Hughes Aircraft Co., Los Angeles, Calif.
Volume
43
Issue
5
fYear
1955
fDate
5/1/1955 12:00:00 AM
Firstpage
603
Lastpage
607
Abstract
The use of point-contact diodes in computer circuitry has shown that diode transient response is important in circuitry employing fast waveforms. Diodes which are pulsed in the back direction from a forward-conducting state may require microseconds to attain a specified back resistance. Transient response depends on circuit impedance and operating conditions, as well as on the diodes themselves. The present lack of ready extrapolation from one transient situation to another requires different tests and criteria for the determination of diode applicability to varying situations. The development and acceptance of a limited number of broadly applicable standard pulse tests is necessary.
Keywords
Circuit stability; Germanium; Impedance; RLC circuits; Resistors; Resonance; Resonant frequency; Semiconductor diodes; Time measurement; Transient response;
fLanguage
English
Journal_Title
Proceedings of the IRE
Publisher
ieee
ISSN
0096-8390
Type
jour
DOI
10.1109/JRPROC.1955.278105
Filename
4055461
Link To Document