DocumentCode :
945719
Title :
Recovery Time Measurements on Point-Contact Germanium Diodes
Author :
Firle, T.E. ; McMahon, M.E. ; Roach, J.F.
Author_Institution :
Hughes Aircraft Co., Los Angeles, Calif.
Volume :
43
Issue :
5
fYear :
1955
fDate :
5/1/1955 12:00:00 AM
Firstpage :
603
Lastpage :
607
Abstract :
The use of point-contact diodes in computer circuitry has shown that diode transient response is important in circuitry employing fast waveforms. Diodes which are pulsed in the back direction from a forward-conducting state may require microseconds to attain a specified back resistance. Transient response depends on circuit impedance and operating conditions, as well as on the diodes themselves. The present lack of ready extrapolation from one transient situation to another requires different tests and criteria for the determination of diode applicability to varying situations. The development and acceptance of a limited number of broadly applicable standard pulse tests is necessary.
Keywords :
Circuit stability; Germanium; Impedance; RLC circuits; Resistors; Resonance; Resonant frequency; Semiconductor diodes; Time measurement; Transient response;
fLanguage :
English
Journal_Title :
Proceedings of the IRE
Publisher :
ieee
ISSN :
0096-8390
Type :
jour
DOI :
10.1109/JRPROC.1955.278105
Filename :
4055461
Link To Document :
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