Title :
Local critical current measurements on (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ tape with an electromagnetic probe
Author :
Telschow, K.L. ; O´Brien, T.K. ; Lanagan, M.T. ; Kaufman, D.Y.
Author_Institution :
Idaho Nat. Eng. Lab., Idaho Falls, ID, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
The use of induced currents from a small noncontacting electromagnetic probe to determine the critical current density in a (Bi,Pb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x//Ag tape on a local scale is described. The technique forces full field penetration into the tape locally and infers the critical current density from the Bean critical state model, accounting for the Ag overlayers. Critical current images of the tape can be obtained by scanning the probe over the tape surface with spatial resolution on the order of 1.0 mm. Results for tapes with different microstructures are discussed.<>
Keywords :
bismuth compounds; calcium compounds; critical current density (superconductivity); electric current measurement; high-temperature superconductors; lead compounds; magnetisation; strontium compounds; superconducting thin films; (BiPb)/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/-Ag tape; Bean critical state model; critical current density; field penetration; local critical current measurement; magnetisation; microstructures; noncontacting electromagnetic probe; spatial resolution; tape surface; Conducting materials; Critical current; Critical current density; Current measurement; Laboratories; Magnetic flux; Magnetic materials; Probes; Strontium; Superconducting films;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
