Title :
Non-equilibrium quasiparticle response to radiation and bolometric effect in YBaCuO films
Author :
Semenov, A.D. ; Goghidze, I.G. ; Gol´tsman, Gregory N. ; Sergeev, A.V. ; Aksaev, E.E. ; Gershenzon, E.M.
Author_Institution :
Moscow Pedagogical Univ., Russia
fDate :
3/1/1993 12:00:00 AM
Abstract :
The voltage photoresponse of structured current biased YBCO films on different substrates to 20-ps laser pulses of 0.63- mu m and 1.54- mu m wavelengths and to continuously modulated radiation of 2-mm wavelength is measured to temperatures around T/sub c/. Fast picosecond decay of the response to pulsed radiation is followed by slow exponential relaxation with a nanosecond characteristic time depending on the substrate material and film dimensions. The slow component does not depend on wavelength and is attributed to the bolometric effect, while the magnitude of the fast component associated with nonequilibrium response rises with wavelength. More than an order-of-magnitude increase of the nonequilibrium response is seen from near-infrared to millimeter-wave range. This dependence plausibly reflects the low efficiency of multiplication of photoexcited electrons in YBaCuO compared to conventional superconductors.<>
Keywords :
barium compounds; bolometers; high-speed optical techniques; high-temperature superconductors; infrared detectors; microwave detectors; quasi-particles; superconducting junction devices; superconducting microwave devices; superconducting thin films; yttrium compounds; 0.63 micron; 1.54 micron; 2 mms; HTSC; YBaCuO films; bolometric effect; fast picosecond decay; film dimensions; nanosecond characteristic time; nonequilibrium quasiparticle response; response to pulsed radiation; slow exponential relaxation; structured current biased; substrate material; voltage photoresponse; Current measurement; Optical films; Optical pulses; Pulse measurements; Pulse modulation; Substrates; Temperature measurement; Voltage; Wavelength measurement; Yttrium barium copper oxide;
Journal_Title :
Applied Superconductivity, IEEE Transactions on