• DocumentCode
    946167
  • Title

    Wavelet denoising of coarsely quantized signals

  • Author

    Neville, Stephen ; Dimopoulos, Nikitas

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Victoria, BC
  • Volume
    55
  • Issue
    3
  • fYear
    2006
  • fDate
    6/1/2006 12:00:00 AM
  • Firstpage
    892
  • Lastpage
    901
  • Abstract
    This paper presents a practical wavelet-based approach to denoising coarsely quantized signals. Such signals can arise from the status data collected within large-scale engineering plants employing traditional limit checking fault detection and identification (FDI). Transitioning such plants to more advanced FDI techniques requires that the coarsely quantized data be accurately denoised. As FDI by its nature is concerned with the analysis of nonstationary signals, wavelets offer an appropriate denoising framework. Existing techniques for optimal wavelet denoising presuppose Gaussian noise contamination and, hence, are suboptimal for coarsely quantized signals. In this paper, a secondary correction stage is added to the standard wavelet-denoising process to improve its denoising performance on coarsely quantized signals. This correction stage exploits a priori knowledge of the known coarsely quantized signal dependencies to "tune" the wavelet thresholds. The effectiveness of the approach is demonstrated through the analysis of real-world data collected from an operational large-scale engineering plant
  • Keywords
    Gaussian noise; quantisation (signal); signal denoising; wavelet transforms; Gaussian noise contamination; fault detection; fault identification; large-scale engineering plants; nonstationary signals analysis; signal quantization; wavelet denoising process; Contamination; Data engineering; Fault detection; Fault diagnosis; Gaussian noise; Large-scale systems; Noise reduction; Signal analysis; Signal processing; Wavelet analysis; Fault diagnosis; noise; quantization; wavelet transforms;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/TIM.2006.873790
  • Filename
    1634883