• DocumentCode
    946685
  • Title

    Ridged LiNbO3 modulators fabricated by a novel oxygen-ion implant/wet-etch technique

  • Author

    Gill, D.M. ; Jacobson, D. ; White, C.A. ; Jones, C.D.W. ; Shi, Y. ; Minford, W.J. ; Harris, Alan

  • Author_Institution
    Bell Labs., Murray Hill, NJ, USA
  • Volume
    22
  • Issue
    3
  • fYear
    2004
  • fDate
    3/1/2004 12:00:00 AM
  • Firstpage
    887
  • Lastpage
    894
  • Abstract
    This paper demonstrates a new ion implantation and wet-etch technique for fabricating high-quality ridged optical waveguides for high-speed LiNbO3-based optical modulators. In addition, the paper demonstrates the fabrication of optical waveguide ridges >3 μm in height with 90°, and even re-entrant sidewall angles for the first time. The modeling used indicates that 90° (and re-entrant) sidewall ridges can reduce the required modulator drive voltage by 10-20% over modulators with conventional trapezoidal ridge profiles fabricated with reactive ion etching. A 40-Gb/s modulator with a 30-GHz bandwidth, 5.1-V switching voltage at 1 GHz, and a 4.8-dB optical insertion loss is fabricated using the ion implantation/wet-etch process. Fabricated devices showed good stability against accelerated aging, indicating that this process could be used for commercial purposes.
  • Keywords
    electro-optical modulation; etching; ferroelectric devices; ion implantation; lithium compounds; optical design techniques; optical fabrication; optical losses; optical waveguides; oxygen; ridge waveguides; LiNbO3; modulator drive voltage; optical fabrication; optical insertion loss; optical modulators; oxygen-ion implantation; reentrant sidewall angles; ridged LiNbO3 modulators; ridged optical waveguides; wet-etch technique; Bandwidth; Etching; High speed optical techniques; Ion implantation; Optical device fabrication; Optical losses; Optical modulation; Optical waveguides; Particle beam optics; Voltage;
  • fLanguage
    English
  • Journal_Title
    Lightwave Technology, Journal of
  • Publisher
    ieee
  • ISSN
    0733-8724
  • Type

    jour

  • DOI
    10.1109/JLT.2004.825764
  • Filename
    1281954