Title :
Automated Josephson integrated circuit test system
Author :
Burroughs, C.J. ; Hamilton, C.A.
Author_Institution :
Nat. Inst. of Sci. & Technol., Boulder, CO, USA
fDate :
3/1/1993 12:00:00 AM
Abstract :
An automated test system for complex superconductive integrated circuits has been developed. Its low-speed capability consists of 96 identical input/output (I/O) channels controlled by a PC-486 computer. Each channel is capable of driving currents and reading voltages at frequencies up to 40 kHz. Integrating this low-speed I/O capability with high-speed test equipment controlled over the IEEE bus allows measurements at frequencies up to the limits of the test equipment. The system can automatically set biases, display I-V curves, measure parameter margins, plot threshold curves, extract experimental circuit values, and collect statistical data on parameter spreads and error rates. Issues of noise suppression, ground loop handling, and autocalibration are discussed.<>
Keywords :
Josephson effect; automatic test equipment; integrated circuit testing; microcomputer applications; superconducting integrated circuits; 40 kHz; ATE; I-V curves; IEEE bus; Josephson integrated circuit; PC-486 computer; autocalibration; automated test system; error rates; ground loop handling; low-speed I/O capability; noise suppression; parameter margins; parameter spreads; statistical data; superconductive integrated circuits; threshold curves; Automatic control; Automatic testing; Circuit testing; Frequency; Integrated circuit measurements; Integrated circuit testing; Superconducting integrated circuits; Superconductivity; System testing; Test equipment;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
