Title :
Optimized structure of sputtered garnet disks
Author :
Kano, H. ; Shono, K. ; Kuroda, S. ; Koshino, N. ; Ogawa, S.
Author_Institution :
Fujitsu Lab. Ltd., Atsugi, Japan
fDate :
9/1/1989 12:00:00 AM
Abstract :
The optimum structure of the sputtered garnet magnetooptical disk was investigated by numerical calculations and experiments. From the Faraday rotation, Faraday ellipticity, refractive index, and extinction coefficient, the authors determined the dielectric tensor elements of a sputtered garnet film. Using these values, they calculated the thickness dependence of the magnetooptical rotation angle, the reflectivity, and the reproduced signal amplitude of the disk with a reflecting layer. These results were then compared with measurements. The optimum garnet thickness and reflector material for a sputtered garnet disk were found. The optimum structure has a carrier/noise ratio of 60 dB at a carrier frequency of 0.6 MHz and possesses good recording sensitivity
Keywords :
Faraday effect; garnets; magneto-optical recording; optical disc storage; sputtered coatings; storage media; 0.6 MHz; Faraday ellipticity; Faraday rotation; carrier frequency; carrier/noise ratio; dielectric tensor elements; extinction coefficient; magnetooptical disk; magnetooptical rotation angle; optical disc storage; optimum structure; recording sensitivity; reflectivity; reflector material; refractive index; reproduced signal amplitude; sputtered garnet disks; thickness dependence; Dielectric materials; Dielectric measurements; Extinction coefficients; Frequency; Garnet films; Magnetic materials; Reflectivity; Refractive index; Signal to noise ratio; Tensile stress;
Journal_Title :
Magnetics, IEEE Transactions on