• DocumentCode
    947455
  • Title

    Theoretical Investigations on Thermal Light Emission From Metallic Carbon Nanotubes

  • Author

    Ouyang, Yijian ; Mann, David ; Dai, Hongjie ; Guo, Jing

  • Author_Institution
    Univ. of Florida, Gainesville
  • Volume
    6
  • Issue
    6
  • fYear
    2007
  • Firstpage
    682
  • Lastpage
    687
  • Abstract
    Electrically driven thermal light emission (TLE) from individual metallic single-walled carbon nanotubes (mCNTs) is theoretically investigated by detailed simulations and compared to a recent experiment (Mann et al., Nature Nanotech.., vol. 2, p. 33, 2007). The electrical and thermal properties are determined by carrier transport in the metallic subband, which has a zero dipole matrix element and does not experience radiative carrier recombination. The light emission, however, is contributed by the semiconducting subbands, which are populated by a thermal process. The simulation results indicate that due to diameter-dependent thermal effects, the maximum current of suspended mCNTs has a much stronger dependence on the CNT diameter than in non suspended CNTs. The size and shape of the light spot are sensitive to the measured photon energy range. Although the temperature profile along the CNT is approximately parabolic, the light emission profile has a much sharper peak at the middle of the CNT, which is in good agreement with the experiment and confirms the thermal nature of the light emission. The light emission spectrum at high energies is affected by the subband and energy dependences of the radiative recombination lifetime.
  • Keywords
    Boltzmann equation; carbon nanotubes; electron-hole recombination; thermoluminescence; Boltzmann transport equation; C; carrier transport; light emission spectrum; metallic single-walled carbon nanotubes; metallic subband; radiative recombination lifetime; semiconducting subbands; thermal light emission; zero dipole matrix element; Carbon nanotubes; device simulation; excited emission; optoelectronic devices; thermal effects;
  • fLanguage
    English
  • Journal_Title
    Nanotechnology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1536-125X
  • Type

    jour

  • DOI
    10.1109/TNANO.2007.907253
  • Filename
    4359115