Title :
Supply-current analysis (scan) as a screen for bipolar integrated circuits
Author_Institution :
Post Office, Research Department, Ipswich, UK
Abstract :
A novel technique utilising the analysis of supply-current variations is proposed as a screen for digital integrated circuits. The application of the method to a simple m.s.i. circuit is used to demonstrate its capability of indicating the presence of flaws at internal circuit nodes.
Keywords :
bipolar integrated circuits; digital integrated circuits; integrated circuit testing; bipolar integrated circuits; digital integrated circuits; screen; supply current analysis;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19780291
