Title :
Gated micrometer-size electron field emitters
Author :
Liu, Deming ; Ravi, T.S. ; Marcus, R.B.
Author_Institution :
Dept. of Electr. Eng., New Jersey Inst. of Technol., Newark, NJ
fDate :
11/1/1992 12:00:00 AM
Abstract :
Summary form only given. A procedure has been developed for making arrays of gated micrometer-size electron field emitters from silicon with some advantages over similar processes developed elsewhere. One-micron-high emitters are made with radii as small as 1 nm, and with self-aligned flat gate electrodes with low capacitance and with the circular gate opening controlled to submicrometer diameter independently of the tip height. Emission measurements show expected Fowler-Nordheim behavior, with the Fowler-Nordheim curves (I/V2 versus 1/V) parallel but displaced along the 1/V axis for different tips. The field factor K (where E=K×V) is derived from the measured slope, and the emission area is derived from K, the Fowler-Nordheim equation, and an assumed work function
Keywords :
electron field emission; elemental semiconductors; silicon; vacuum microelectronics; Fowler-Nordheim curves; Si; circular gate opening; emission area; field factor; gated micrometer-size electron field emitters; low capacitance; self-aligned flat gate electrodes; Circuits; Electron emission; Etching; Gallium arsenide; HEMTs; Indium gallium arsenide; MESFETs; MODFETs; Silicon compounds; Voltage;
Journal_Title :
Electron Devices, IEEE Transactions on