DocumentCode
947643
Title
Controlled Vacuum Breakdown in Carbon Nanotube Field Emission
Author
Baik, Chan-Wook ; Lee, Jeonghee ; Chung, Deuk Seok ; Choi, Jun Hee ; Han, In-Taek ; Kim, Ha Jin ; Park, Shang Hyeun ; Kim, Sun Il ; Jin, Yong Wan ; Kim, Jong-Min ; Kim, Jin Young ; Yu, SeGi ; Jang, Kyu-Ha ; Park, Gun-Sik
Author_Institution
Samsung Adv. Inst. of Technol., Yongin
Volume
6
Issue
6
fYear
2007
Firstpage
727
Lastpage
733
Abstract
We report a physical mechanism of controlling vacuum breakdown in field emission from carbon nanotubes (CNTs). The thermal evaporation or runaway of CNT emitters is considered to be responsible for destructive vacuum breakdowns due to an overcurrent through electronically shorted circuits, where misaligned or irregularly long CNT emitters were found. The occurrence of the destructive breakdown, however, could be under control after an electrical treatment using soft breakdowns. Significant improvements of field emission stability and uniformity were achieved by optimally controlled soft breakdowns, which eliminated the short circuits and recovered the field emission with no destruction of electrodes.
Keywords
carbon nanotubes; electrodes; evaporation; field emission; vacuum breakdown; C; CNT emitters; carbon nanotube field emission; controlled vacuum breakdown; electrical treatment; electrodes; electronically shorted circuits; thermal evaporation; Carbon nanotube; electrical treatment; field emission; vacuum breakdown;
fLanguage
English
Journal_Title
Nanotechnology, IEEE Transactions on
Publisher
ieee
ISSN
1536-125X
Type
jour
DOI
10.1109/TNANO.2007.908483
Filename
4359133
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